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X-Ray Fluorescence Spectrometer (XRF)
This spectrometer provides a nondestructive way to identify and determine concentrations of elements present in solid, powdered, and liquid samples. It is widely used for measuring coating thickness. |
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X-Ray Diffractometer (XRD) With Fe and Cu Anode
This instrument is used for the characterization of solid-phase material. |
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Thermogravimetry-Calorimetry With Evolved Gas Analysis by Mass Spectrometry (TG/DSC-MS)
This instrument is used to characterize solid-phase material. |
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Scanning Electron Microscope With Energy Dispersive Spectrometer (SEM-EDS)
This instrument is used for the characterization of solid-phase material.
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BET Surface Area Analyzer
This instrument analyzes the specific surface area of materials, such as nanomaterials, pharmaceutical materials, powder metallurgy materials, battery active materials, fibers, pigments, thermal spray powders, minerals, and additives. |
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Zeta Potential Analyzer
This analyzer provides critical information about the stability of a wide range of emulsions and colloidal suspensions. |
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Particle Size Analyzer
This analyzer is used to characterize spherical or irregularly shaped fiber particles, as well as agglomerations, mixtures, extreme concentrations and volumes, and concentration measurements. |
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UV-Vis Diffuse-Reflectance Spectrophotometer
This spectrophotometer is used to determine the absorbance of a sample, ultimately allowing for the determination of color or concentration. |
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Carbon and Sulfur Coulometers
These coulomoters are used for characterizing solid materials used in experimental studies and aquifer solids collected from field sites. The concentrations of compounds containing carbon and sulfur often play a role in the fate and transport behaviors of contaminant species. |